• Title of article

    Surface X-ray diffraction in transmission geometry

  • Author/Authors

    Hiroo Tajiri، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2004
  • Pages
    6
  • From page
    403
  • To page
    408
  • Abstract
    We performed transmission X-ray diffraction (TXD) experiments with a Si(1 1 1) sample and an image plate in air. A large number of crystal truncation rod (CTR) scatterings can be collected all at once in transmission geometry by suppressing thermal diffuse scattering from a bulk. This benefit makes us free from time-consuming measurements in surface X-ray diffraction. In addition, intensities along CTRs were obtained correctly. Further progress in TXD under an ultra-high vacuum condition is also discussed with the results obtained from a Si(1 1 1)-7 7 surface. # 2004 Elsevier B.V. All rights reserved.
  • Keywords
    Surface structure , Reconstructed surface , X-ray diffraction , Silicon
  • Journal title
    Applied Surface Science
  • Serial Year
    2004
  • Journal title
    Applied Surface Science
  • Record number

    1000145