Title of article :
Quantitative analysis and thickness dependence study of
Langmuir-Blodgett films of functionalized platinum
nanoparticles by X-ray photoelectron spectroscopy
Author/Authors :
Fre´de´ric Raynal، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Abstract :
This paper reports the analysis of 4-mercaptoaniline (p-HSC6H4NH2) functionalized platinum nanoparticles by X-ray
photoelectron spectroscopy (XPS). The spectra are recorded on mixed Langmuir-Blodgett (LB) films containing fatty acid and
platinum particles in proportion 50/50. The LB films are deposited on gold layer made by thermal evaporation on glass substrate.
The quite good stability of the nanomaterial under X-ray exposure is reported from one minute to two hours thirty. A line profile
is conducted on seventeen points of a LB film to check the good homogeneity of the deposition. The elemental composition of
the nanoparticule core-shell structure is reported for platinum sulfur and nitrogen. Then, the evolution of the Pt 4f core level
intensity compared to the Au 4f signal coming from the burried gold electrode is established as a function of film thickness. From
this analysis the effective electron attenuation length of Pt 4f photoelectrons and the effective value of platinum atom density are
determined. Further exploitation of these data leads to an averaged interparticle distance in the nanocomposite. Comparison of
these results with those recorded from X-rays reveals a quite good aggreement and validates the XPS intensities treatment.
Keywords :
Effective electron attenuation length and atom density , Nanoparticule , Pt , thiol , Langmuir-Blodgett film , XPS
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science