Title of article
Structural and morphological changes on surfaces with multiple phases studied by low-energy electron microscopy
Author/Authors
H. Hibino، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
7
From page
51
To page
57
Abstract
We used low-energy electron microscopy to study structural and morphological changes of Si(1 1 1) on which ‘‘1 1’’ and 7
7 coexist. Because ‘‘1 1’’ and 7 7 have different thermodynamic and kinetic properties, various interesting phenomena
unique to the two-phase surface take place. The difference in the surface mass diffusion constant, coupled with the preferential
nucleation of 7 7 at the upper step edges, effectively causes a diffusion barrier at the upper side of the step, resulting in the
selective slowing down of vacancy island decay and step wandering during homoepitaxial growth. The difference in the surface
mass diffusion constant also influences the step motion caused by the difference in the atom density. The 7 7 domains coarsen
to reduce the energetic cost of the boundaries consisting of narrow ‘‘1 1’’ regions. We demonstrate that von Neumann’s law
governs the coarsening
Keywords
Low-energy electron microscopy , Surface structure , Silicon
Journal title
Applied Surface Science
Serial Year
2004
Journal title
Applied Surface Science
Record number
1000290
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