Title of article
AES and XPS studies of a GaP(0 0 1) surface treated by S2Cl2 and P2S5/(NH4)2Sx
Author/Authors
K.Z. Liu، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
4
From page
627
To page
630
Abstract
A GaP(0 0 1) surface treated by S2C12 and P2S5/(NH4)2Sx solutions has been investigated by AES and XPS. The amount of
sulfur on the surface treated by the P2S5/(NH4)2Sx solution is more than that by the (NH4)2Sx. The sulfur coverage on the S2Cl2-
and P2S5/(NH4)2Sx-treated samples annealed at 550 8C was estimated to be about 1.2–1.3 monolayers. It is found that the
adsorbed sulfur is stable below 550 8C and oxygen on the surface is almost removed at 550 8C. Chlorine atoms on the GaP(0 0 1)
surface treated by S2C12 were easily desorbed upon annealing. The XPS result indicates that the adsorbed sulfur is bonded
mainly to the Ga atoms on the surface
Keywords
S2C12 , AES , XPS , Passivation , P2S5 , GAP
Journal title
Applied Surface Science
Serial Year
2004
Journal title
Applied Surface Science
Record number
1000392
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