Title of article :
Characterization of TiN thin films subjected to nanoindentation
using focused ion beam milling
Author/Authors :
L.W. Marcoux، نويسنده , , J.M. Cairney، نويسنده , , M.J. Hoffman، نويسنده , , P.R. Munroe، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Abstract :
The microstructure and surface morphology of a TiN hard, wear resistant coating on a V820 nitridable alloy ductile steel
substrate following nanoindentation have been characterized using focused ion beam (FIB) milling. ATiN coating, 0.6 mm in
thickness, was deposited on a ductile steel substrate using a cathodic arc evaporation (CAE) technique. Pop-in events were
observed in the load–displacement curves and correlated to the observed microstructural features. Following nanoindentation
with a 1 mm radius spherical indenter at loads of 100 mN and 500 mN, circumferential cracks were observed inside the
indentation. Observations of nanoindented cross-sections prepared using FIB revealed both columnar cracks in the coating and
shear steps at the coating–substrate interface. These structural features were observed at higher resolution using a transmission
electron microscope (TEM).
Keywords :
Nanoindentation , TIN , thin films , FIB
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science