• Title of article

    Characterization of TiN thin films subjected to nanoindentation using focused ion beam milling

  • Author/Authors

    L.W. Marcoux، نويسنده , , J.M. Cairney، نويسنده , , M.J. Hoffman، نويسنده , , P.R. Munroe، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2004
  • Pages
    5
  • From page
    631
  • To page
    635
  • Abstract
    The microstructure and surface morphology of a TiN hard, wear resistant coating on a V820 nitridable alloy ductile steel substrate following nanoindentation have been characterized using focused ion beam (FIB) milling. ATiN coating, 0.6 mm in thickness, was deposited on a ductile steel substrate using a cathodic arc evaporation (CAE) technique. Pop-in events were observed in the load–displacement curves and correlated to the observed microstructural features. Following nanoindentation with a 1 mm radius spherical indenter at loads of 100 mN and 500 mN, circumferential cracks were observed inside the indentation. Observations of nanoindented cross-sections prepared using FIB revealed both columnar cracks in the coating and shear steps at the coating–substrate interface. These structural features were observed at higher resolution using a transmission electron microscope (TEM).
  • Keywords
    Nanoindentation , TIN , thin films , FIB
  • Journal title
    Applied Surface Science
  • Serial Year
    2004
  • Journal title
    Applied Surface Science
  • Record number

    1000393