Title of article :
Recent progress in energy-filtered high energy X-ray photoemission electron microscopy using a Wien filter type energy analyzer
Author/Authors :
H. Niimi، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
4
From page :
641
To page :
644
Abstract :
Energy-filtered X-ray photoemission electron microscopy (EXPEEM) is a microscopy technique which has the potential to provide surface chemical mapping during surface chemical processes on the nanometer scale. We studied the possibilities of EXPEEM using a Wien filter type energy analyzer in the high energy X-ray region above 1000 eV. We have successfully observed the EXPEEM images of Au islands on a Ta sheet using Au 3d5/2 and Ta 3d5/2 photoelectron peaks which were excited by 2380 eV X-rays emitted from an undulator (BL2A) at Photon Factory. Our recent efforts to improve the sensitivity of the Wien filter energy analyzer will also be discussed
Keywords :
Wien filter , EXPEEM , Photoemission electron microscopy , Spectromicroscopy , PEEM
Journal title :
Applied Surface Science
Serial Year :
2004
Journal title :
Applied Surface Science
Record number :
1000395
Link To Document :
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