Title of article
Development of imaging energy analyzer using multipole Wien filter
Author/Authors
H. Niimi، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
4
From page
131
To page
134
Abstract
We discussed a new design of aWien filter energy analyzer for an energy-filtered X-ray photoemission electron microscopy
system. We have demonstrated that the second-order aberration and the third-order aperture aberration can be corrected by the
multipole Wien filter by adjusting multipole components of electric and magnetic fields up to octupole components. The threedimensional
charge simulation method indicated that 12 electrodes and magnetic poles can effectively reproduce these ideal
electric and magnetic fields.
Keywords
XPEEM , multipole , Aberration correction , Wien filter
Journal title
Applied Surface Science
Serial Year
2005
Journal title
Applied Surface Science
Record number
1000636
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