Title of article :
Development of imaging energy analyzer using
multipole Wien filter
Author/Authors :
H. Niimi، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Abstract :
We discussed a new design of aWien filter energy analyzer for an energy-filtered X-ray photoemission electron microscopy
system. We have demonstrated that the second-order aberration and the third-order aperture aberration can be corrected by the
multipole Wien filter by adjusting multipole components of electric and magnetic fields up to octupole components. The threedimensional
charge simulation method indicated that 12 electrodes and magnetic poles can effectively reproduce these ideal
electric and magnetic fields.
Keywords :
XPEEM , multipole , Aberration correction , Wien filter
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science