Title of article
Temperature dependence of current–voltage characteristics of Ag/p-SnS Schottky barrier diodes
Author/Authors
Mehmet S¸ahin، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
7
From page
412
To page
418
Abstract
The current–voltage (I–V) measurements on Ag/p-SnS Schottky barrier diodes in the temperature range 100–300 K were
carried out. It has been found that all contacts are of Schottky type. The ideality factor and the apparent barrier height calculated
by using thermionic emission (TE) theory were found to be strongly temperature dependent. The I–V curves is fitted by the
equation based on thermionic emission theory, but the zero-bias barrier height (FB0) decreases and the ideality factor (n)
increases with decreasing temperature. The conventional Richardson plot exhibits non-linearity below 200 K with the linear
portion corresponding to activation energy of 0.32 eV. It is shown that the values of Rs estimated from Cheung’s method were
strongly temperature dependent and decreased with increasing temperature. From the reverse-bias I–V graphs, it is found that the
experimental carrier density (NA) values increased with increasing temperature.
Keywords
Schottky barrier diode , I–V characteristics , IV–VI layered semiconductor compounds
Journal title
Applied Surface Science
Serial Year
2005
Journal title
Applied Surface Science
Record number
1000744
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