• Title of article

    Evidence of refractive index change in glass substrates induced by high-density reactive ion plating deposition of SiO2 films

  • Author/Authors

    Jan Mistrik*، نويسنده , , Ivan Ohlidal1، نويسنده , , Roman Antos، نويسنده , , Mitsuru Aoyama، نويسنده , , Tomuo Yamaguchi، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2005
  • Pages
    4
  • From page
    51
  • To page
    54
  • Abstract
    High-density reactive ion plating was used for SiO2 coating of Schott B270 glass. Optical properties of the sample were intensively studied by spectroscopic ellipsometry, reflectance and transmittance. Several optical models accounting for different structural defects, i.e., (1) gradient profile of refractive index in SiO2 layer, (2) transition layer between SiO2 and glass, and (3) induced slow variation of glass refractive index close to SiO2/glass interface were considered. The last one with increased value of substrate refractive index gave the best correspondence with the experimental data
  • Keywords
    ellipsometry , reflectometry , Ion plating , SiO2/glass interface , Change of refractive index , Plasma-assisted deposition , SchottB270
  • Journal title
    Applied Surface Science
  • Serial Year
    2005
  • Journal title
    Applied Surface Science
  • Record number

    1000816