Title of article
Influence of reacting nitrogen gas consistence on the properties of TiN films prepared by rf. magnetron sputtering
Author/Authors
Y. Pihosh، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
4
From page
244
To page
247
Abstract
Structural and mechanical properties of the TiN films deposited on stainless-steel substrates by rf. magnetron sputtering have
been studied. The TiN films of few hundreds of nanometers in thickness were fabricated, varying both the total pressure of the
N2/Ar reactive gas mixture and N2 partial pressure in a chamber. It was found that the morphology of the TiN films strongly
depended on the N2 concentration of the working gas. A formation of the (2 0 0) phase was detected at 50% of N2 concentration.
The tribological properties of the deposited films strongly depended on the total pressure. A low frictional coefficient of 0.14 has
been measured for TiN films deposited at 50% of N2, at a total pressure 9 Pa.
Keywords
TIN , Microstructure , Ttribology , rf. Magnetron sputtering , Surface energy
Journal title
Applied Surface Science
Serial Year
2005
Journal title
Applied Surface Science
Record number
1000859
Link To Document