Title of article :
Nanocrystals formation and fractal microstructural
assessment in Au/Ge bilayer films upon annealing
Author/Authors :
Z.W. Chen*، نويسنده , , J.K.L. Lai، نويسنده , , C.H. Shek، نويسنده , , H.D. Chen and S.L. Ma، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Abstract :
Nanocrystals formation and fractal microstructural assessment in Au/Ge bilayer films upon annealing have been investigated
by transmission electron microscopy and high-resolution transmission electron microscopy observations. Experimental results
indicated that the microstructure of the metal Au film plays an important role in metal-induced crystallization for Au/Ge bilayer
films upon annealing. Synchronously, the crystallization processes of amorphous Ge accompanied by the formation of Ge fractal
clusters, which were composed of Ge nanocrystals.We found that the grain boundaries of polycrystalline Au film were the initial
nucleation sites of Ge nanocrystals. High-resolution transmission electron microscopy observations showed successive
nucleation of amorphous Ge at Au grain boundaries near fractal tips. The crystallization process was suggested to be diffusion
controlled and a random successive nucleation and growth mechanism
Keywords :
nanocrystal , Au/Ge bilayer films , fractal , HRTEM
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science