Title of article :
Analysis of the carrier concentration for field
emission from AlxGa1 xN
Author/Authors :
Tae S. Choi، نويسنده , , Moon S. Chung *، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Abstract :
The field emission current density j from the ternary alloy AlxGa1 xN is theoretically calculated as a function of composition
x for 0 x 1. By considering the doping and background concentrations and the internal field emission as sources of the
carrier concentration n, we use a fully exact scheme to calculate j from AlxGa1 xN. It is found that the exact x-dependence of n
yields theoretical j in agreement with experiment
Keywords :
Field emission , AlGaN , Schottky barrier , Electron affinity , carrier concentration
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science