Title of article :
Analysis of the carrier concentration for field emission from AlxGa1 xN
Author/Authors :
Tae S. Choi، نويسنده , , Moon S. Chung *، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
5
From page :
191
To page :
195
Abstract :
The field emission current density j from the ternary alloy AlxGa1 xN is theoretically calculated as a function of composition x for 0 x 1. By considering the doping and background concentrations and the internal field emission as sources of the carrier concentration n, we use a fully exact scheme to calculate j from AlxGa1 xN. It is found that the exact x-dependence of n yields theoretical j in agreement with experiment
Keywords :
Field emission , AlGaN , Schottky barrier , Electron affinity , carrier concentration
Journal title :
Applied Surface Science
Serial Year :
2005
Journal title :
Applied Surface Science
Record number :
1001386
Link To Document :
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