Title of article
Further indication of a low quartz structure at the SiO2/Si interface from coincidence Doppler broadening spectroscopy
Author/Authors
G. Brauer، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
4
From page
3368
To page
3371
Abstract
Results from coincidence Doppler broadening (CDB) measurements on various Si samples and Brazilian quartz having low
quartz structure are presented with the aim to give further strong indication of the existence of a low quartz structure, but not of Si
divacancies as frequently considered, at the SiO2/Si interface.
Keywords
Slow-positron spectroscopy , Coincidence Doppler broadening , Brazilian quartz , Silicon , Silicon divacancy , SiO2/Si interface
Journal title
Applied Surface Science
Serial Year
2006
Journal title
Applied Surface Science
Record number
1001853
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