Title of article :
Chemical alteration of poly(vinyl fluoride) Tedlar1 induced by exposure to vacuum ultraviolet radiation
Author/Authors :
Michael L. Everett، نويسنده , , Gar B. Hoflund *، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
10
From page :
3789
To page :
3798
Abstract :
In this study the chemical alteration of poly(vinyl fluoride) Tedlar1 by vacuum ultraviolet radiation (VUV) (115–400 nm) has been examined using X-ray photoelectron spectroscopy (XPS). The initial F/C atom ratio of 0.34 decreases to 0.17 after a 2-h exposure. The F/C atom ratio is further reduced to a steady-state value of approximately 0.04 after a 24-h exposure. Similarly, the O/C atom ratio is reduced from 0.08 to 0.05 and then to 0.02 during these two exposures. As the F and O are removed by VUV exposure, the C concentration increases from 70.5 to 82.0 and then to 94.6 at.% thus forming a graphitic or amorphous carbonlike layer which erodes more slowly than the virgin Tedlar surface. Exposure of the VUV-damaged surface to O2 results in chemisorption of O, indicating that reactive sites are formed during the chemical erosion by VUV. Further exposure to VUV removes this chemisorbed oxygen but a subsequent exposure to air at atmospheric conditions causes a three-fold increase in O chemisorbed at the surface. Comparison of XPS data indicates that the mechanisms of chemical alteration by VUV radiation and hyperthermal ( 5 eV) atomic oxygen (AO) are similar.
Keywords :
Fluoromers , fluoropolymers , Teflon , Tefzel , XPS , Ao , VUV , Low Earth Orbit , LEO , Tedlar
Journal title :
Applied Surface Science
Serial Year :
2006
Journal title :
Applied Surface Science
Record number :
1001910
Link To Document :
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