Title of article
Chemical alteration of poly(vinyl fluoride) Tedlar1 induced by exposure to vacuum ultraviolet radiation
Author/Authors
Michael L. Everett، نويسنده , , Gar B. Hoflund *، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
10
From page
3789
To page
3798
Abstract
In this study the chemical alteration of poly(vinyl fluoride) Tedlar1 by vacuum ultraviolet radiation (VUV) (115–400 nm)
has been examined using X-ray photoelectron spectroscopy (XPS). The initial F/C atom ratio of 0.34 decreases to 0.17 after a 2-h
exposure. The F/C atom ratio is further reduced to a steady-state value of approximately 0.04 after a 24-h exposure. Similarly, the
O/C atom ratio is reduced from 0.08 to 0.05 and then to 0.02 during these two exposures. As the F and O are removed by VUV
exposure, the C concentration increases from 70.5 to 82.0 and then to 94.6 at.% thus forming a graphitic or amorphous carbonlike
layer which erodes more slowly than the virgin Tedlar surface. Exposure of the VUV-damaged surface to O2 results in
chemisorption of O, indicating that reactive sites are formed during the chemical erosion by VUV. Further exposure to VUV
removes this chemisorbed oxygen but a subsequent exposure to air at atmospheric conditions causes a three-fold increase in O
chemisorbed at the surface. Comparison of XPS data indicates that the mechanisms of chemical alteration by VUV radiation and
hyperthermal ( 5 eV) atomic oxygen (AO) are similar.
Keywords
Fluoromers , fluoropolymers , Teflon , Tefzel , XPS , Ao , VUV , Low Earth Orbit , LEO , Tedlar
Journal title
Applied Surface Science
Serial Year
2006
Journal title
Applied Surface Science
Record number
1001910
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