Title of article :
The influence of chemical treatment and thermal annealing on AlxGa1 xN surfaces: An XPS study
Author/Authors :
B. Boudjelida *، نويسنده , , M.C. Simmonds، نويسنده , , I. Gee، نويسنده , , S.A. Clark، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
8
From page :
5189
To page :
5196
Abstract :
The influences of chemical treatment and thermal annealing of AlxGa1 xN (x = 0.20) have been investigated by X-ray photoelectron spectroscopy (XPS). XPS analysis showed that successive chemical treatments and annealing produced changes in the stoichiometry of the AlxGa1 xN surface, with the surface concentration of N increasing and Al and Ga decreasing with increasing temperature. Band bending occurred at the AlxGa1 xN surface, in parallel with the observed changes in stoichiometry. These results are discussed in the context of the creation of surface states via the activation of vacancies and induced by defects. These findings point towards the possibility of selecting and/or engineering the band structure at AlxGa1 xN surfaces through a combination of surface preparation and annealing.
Keywords :
annealing , AlGaN , Fermi level pinning , Surface
Journal title :
Applied Surface Science
Serial Year :
2006
Journal title :
Applied Surface Science
Record number :
1002132
Link To Document :
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