Title of article
Nanowire growth on Si wafers by oxygen implantation and annealing
Author/Authors
Elder A. de Vasconcelos، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
3
From page
5572
To page
5574
Abstract
We report on nanowire formation on oxygen implanted Si wafers. In this method, a Si wafer is first oxygen-implanted and then annealed at high
temperatures in Ar ambient to promote growth of nanowires with high aspect ratio. Their lengths range from several micrometers to thousands of
micrometers and their diameters range from tens of nanometers to a few microns
Keywords
Silicon nanowires , stress , Ion implantation
Journal title
Applied Surface Science
Serial Year
2006
Journal title
Applied Surface Science
Record number
1002216
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