• Title of article

    Chemical effects in C60 irradiation of polymers

  • Author/Authors

    R. Mo¨llers، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2006
  • Pages
    4
  • From page
    6509
  • To page
    6512
  • Abstract
    The C60 erosion behaviour of poly(methyl)methacrylate (PMMA), poly(a-methyl)styrene (PAMS) and polystyrene (PS) has been studied at various temperatures and compared with that under Ga+ irradiation. Strong variations of erosion yields are observed, indicating that chemical degradation mechanisms are operating. In particular, our results suggest that fast depolymerization mechanisms are important in leaving the surface of the sputter crater virtually undamaged. Since such mechanisms are connected with the chemical nature of the polymer, the possibility of performing molecular depth profiling of polymers with C60 appears to depend strongly on the chemical nature of the system under study.
  • Keywords
    Cluster SIMS , Fullerene ion beam , Depth profiling , Polymers , radiation damage , TOF-SIMS
  • Journal title
    Applied Surface Science
  • Serial Year
    2006
  • Journal title
    Applied Surface Science
  • Record number

    1002370