Title of article :
Fundamental studies of the cluster ion bombardment of water ice
Author/Authors :
Christopher Szakal، نويسنده , , Joseph Kozole، نويسنده , , Nicholas Winograd، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
3
From page :
6526
To page :
6528
Abstract :
The fundamental sputtering properties of water ice are of interest for molecular depth profiling of biological samples in their native environment. We report on a method of studying amorphous water ice films of precise thicknesses in which pure water vapor is condensed onto a pre-cooled, silver-coated quartz crystal microbalance (QCM). This scheme allows for the determination of water ice sputter yields for any primary projectile as well as providing a means for studying escape depths of atoms and molecules beneath the deposited water ice layer. Specifically, we find a removal of approximately 2500 water molecule equivalents/20 keV C60 + projectile with an underlying silver ion escape depth of 7.0 A°
Keywords :
Sputter yield , TOF-SIMS , Cluster ion , Water ice , C60+
Journal title :
Applied Surface Science
Serial Year :
2006
Journal title :
Applied Surface Science
Record number :
1002374
Link To Document :
بازگشت