Title of article
3D-TOFSIMS characterization of black spots in polymer light emitting diodes
Author/Authors
C.W.T. Bulle-Lieuwmaa، نويسنده , , P. van de Weijer، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
4
From page
6597
To page
6600
Abstract
The occurrence and formation of black spots areas in PolyLED devices has been studied by time-of-flight SIMS (TOFSIMS). The composition,
shape and position of the black spots is visualised by three-dimensional (3D)-TOFSIMS depth-profiling. It has been established that the formation
of non-emissive spots is due to the growth of aluminium oxide clusters at the AlBa/polymer interface. Electron injection in the black spots is lost by
the resulting local increase of the resistivity of the cathode.
Keywords
Black spots , resistivity , PolyLED devices , cathode , Time-of-flight
Journal title
Applied Surface Science
Serial Year
2006
Journal title
Applied Surface Science
Record number
1002391
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