Title of article
Secondary ionization mass spectrometric analysis of impurity element isotope ratios in nuclear reactor materials
Author/Authors
D.C. Gerlach، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
4
From page
7041
To page
7044
Abstract
During reactor operations and fuel burn up, some isotopic abundances change due to nuclear reactions and provide sensitive indicators of
neutron fluence and fuel burnup. Secondary ion mass spectrometry (SIMS) analysis has been used to measure isotope ratios of selected impurity
elements in irradiated nuclear reactor graphite. Direct SIMS measurements were made in graphite samples, following shaping and surface
cleaning. Models predicting local fuel burnup based on isotopic measurements of B and Li isotopes by SIMS agreed well with U and Pu isotopic
measurements obtained by thermal ionization mass spectrometry (TIMS).
Keywords
SIMS , Nuclear reactors , Isotope ratios , Graphite
Journal title
Applied Surface Science
Serial Year
2006
Journal title
Applied Surface Science
Record number
1002479
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