• Title of article

    Applications of SIMS to cultural heritage studies

  • Author/Authors

    A. Adriaens، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2006
  • Pages
    6
  • From page
    7096
  • To page
    7101
  • Abstract
    This paper discusses the use of secondary ion mass spectrometry in cultural heritage studies recently reported in the literature, and includes material on the analysis of pigments, glass and metals. Applications of depth profiling, imaging, speciation and the topic of ultra-low energy SIMS depth profiling are addressed
  • Keywords
    SIMS , Cultural heritage , Inorganic materials , imaging , Speciation , Depth profiling
  • Journal title
    Applied Surface Science
  • Serial Year
    2006
  • Journal title
    Applied Surface Science
  • Record number

    1002493

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=1002493