• Title of article

    The electron counting rule and passivation of compound semiconductor surfaces

  • Author/Authors

    G.P. Srivastava، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2006
  • Pages
    8
  • From page
    7600
  • To page
    7607
  • Abstract
    A brief review is presented of the role of electron counting rule (ECR) in explaining structural stability and passivation of compound semiconductor surfaces. While III–V(1 1 0) and majority of III–V(0 0 1) and III–V(1 1 1) surfaces reconstruct in accordance with the ECR, there are a few low- and high-index surfaces which disobey the ECR but stabilize by sustaining significant elastic deformation in the surface region.We explain the latter scenario with the help of computational results for the geometric and electronic structure of GaSb(0 0 1)-(1 3), GaSb(0 0 1)- c(2 6), InP(1 1 1)A-( ffiffiffi 3 p ffiffiffi 3 p ), and GaAs(1 1 1)B–Sb(1 3).We also discuss hydrogen passivation of these surfaces. It is pointed out that the recently observed stable InP(1 1 1)A-( ffiffiffi 3 p ffiffiffi 3 p ) surface can be both chemically and electronically passivated by exposing it to a hydrogen gas of one quarter of a monolayer coverage
  • Keywords
    Surface reconstructions , Pseudopotential method1. IntroductionThe importance of semiconductor surfaces and interfaces intechnologically important device applications is well established.In particular , substrates of compound semiconductors , Compound semiconductor surfaces , such as zinc-blende III–Vs , and exploit , are believed to be very important inthe development of wireless communications and optoelectronicstechnology. In order to fully understand , such substrates , Surface passivation , Density functional theory
  • Journal title
    Applied Surface Science
  • Serial Year
    2006
  • Journal title
    Applied Surface Science
  • Record number

    1002592