Title of article :
Quantum states in fabricating poly-Si films
Author/Authors :
Ruimin Jin *، نويسنده , , Jingxiao Lu b، نويسنده , , Yu Ja، نويسنده , , Shie Yang، نويسنده , , Liwei Zhang، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
3
From page :
8258
To page :
8260
Abstract :
The quantum states are presented in these processions of fabricating poly-Si films. Amorphous silicon films prepared by PECVD has been crystallized by conventional furnace annealing (FA) and rapid thermal annealing (RTA), respectively. It is found that the thin films grain size present quantum states with the increasing of the gas flow ratios of SiH4, H2 mixture, substrate temperatures, frequency power, annealing temperature and time.
Keywords :
grain size , Pulsed rapid thermal annealing , Quantum states , PECVD , Conventional furnace annealing
Journal title :
Applied Surface Science
Serial Year :
2006
Journal title :
Applied Surface Science
Record number :
1002700
Link To Document :
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