Title of article :
Structural and optical characterization of the propolis films
Author/Authors :
S.I. Drapak، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
4
From page :
279
To page :
282
Abstract :
We have performed structural and optical characterizations of the propolis (an organic entity of biological nature) films grown on various nonorganic substrates. The films were grown from a propolis melt or a propolis alcohol solution. The crystal structure has been observed in the films precipitated from the solution onto substrates such as an amorphous glass and sapphire or semiconductor indium monoselenide. For any growth method, the propolis film is a semiconductor with the bandgap of 3.07 eVat 300 K that is confirmed by a maximum in photoluminescence spectra at 2.86 eV. We argue that propolis films might be used in various optoelectronic device applications
Keywords :
morphology , Semiconductor , heterostructure
Journal title :
Applied Surface Science
Serial Year :
2006
Journal title :
Applied Surface Science
Record number :
1002838
Link To Document :
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