Title of article :
Possibilities of C 1s XPS and N(E) C KVV Auger spectroscopy for identification of inherent peculiarities of diamond growth
Author/Authors :
A.P Dementjev، نويسنده , , K.I Maslakov، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
6
From page :
1095
To page :
1100
Abstract :
The interaction of C-atoms and CHn-radicals with uncleaned and argon cleaned silicon substrate and with diamond surface after H-treatment have been studied in situ by XPS and Auger spectroscopy. It was found the formation of a new chemical surface state of carbon atoms in the case of carbon atoms and radicals interaction with cleaned silicon. The same chemical state was revealed on the H-treated diamond surface. Graphite-like structure of carbon atoms was observed on the surface of unlearned silicon and H-treated diamond after interaction with carbon atoms and radicals. N(E) C KVVAuger spectrum for the new chemical state of carbon atoms significantly differs from typical spectra for sp2- and sp3-bonded carbon materials. The high energy part of this spectrum was interpreted under the hypothesis of sp3-bonded carbon atoms but with shifted fermi level position.
Keywords :
XPS , XAES , Nucleation , Diamond , growth
Journal title :
Applied Surface Science
Serial Year :
2006
Journal title :
Applied Surface Science
Record number :
1002973
Link To Document :
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