Abstract :
The surface modifications of Mo massive samples (0.5 mm foils) made by nitrogen ion implantation are studied by SEM, XRD, AFM, and
SIMS. Nitrogen ions in the energy range of 16–30 keV with a fluence of 1 1018 N+ cm 2 were implanted in molybdenum samples for 1600 s at
different temperatures. XRD patterns clearly showed MoN (0 3 1) (hcp) very close to Mo (2 0 0) line. Crystallite sizes (coherently diffracting
domains) obtained from MoN (0 3 1) line, showed an increase with substrate temperature. AFM images showed the formation of grains on Mo
samples, which grew in size with temperature. Similar morphological changes to that has been observed for thin films by increasing substrate
temperature (i.e., structure zone model (SZM)), is obtained. The density of implanted nitrogen ions and the depth of nitrogen ion implantation in
Mo studied by SIMS showed a minimum for N+ density as well as a minimum for penetration depth of N+ ions in Mo at certain temperatures, which
are both consistent with XRD results (i.e., IMo (2 0 0)/IMo (2 1 1)) for Mo (bcc). Hence, showing a correlation between XRD and SIMS results. This
phenomenon is explained on the basis of residual gas, substrate temperature, dissociation of water in the chamber and the ion energy.
Keywords :
depth profile , Ion implantation , Molybdenum , SEM , AFM , XRD , SIMS