Abstract :
We have grown zinc-blende cadmium selenide (CdSe) epilayers on ZnTe-(0 0 1) substrate by molecular beam epitaxy (MBE). By controlling
the substrate temperature and beam-equivalent pressure (BEP) ratio, of Se to Cd, we determined the most suitable growth condition based on
reflection high-energy electron diffraction (RHEED) pattern. At a substrate temperature of 280 8C and a BEP ratio of 3.6, the RHEED pattern
showed a V-like feature, indicating a rough surface with facets. As the substrate temperature was increased to 360 8C at the same BEP ratio, a V-like
RHEED pattern moved to a clear streaky pattern. Moreover when the BEP ratio was increased to 4.8 at 360 8C of substrate temperature, a clear
(2 1) reconstruction of the CdSe layer was observed. A CdSe/CdMgSe single quantum well structure was also grown on ZnTe-(0 0 1) substrate
by MBE. The RHEED pattern showed a clear (2 1) surface reconstruction during the growth. By photoluminescence measurement, a good
optical property of the structure was obtained.
Keywords :
CdSe epilayers , CdSe/CdMgSe quantum well , RHEED patterns , ZnTe substrate , XRD