Title of article :
Stabilization in electrical characteristics of hydrogen-annealed ZnO:Al films
Author/Authors :
Byeong-Yun Oh، نويسنده , , Min-Chang Jeong، نويسنده , , Jae-Min Myoung، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2007
Pages :
5
From page :
7157
To page :
7161
Abstract :
Al-doped ZnO (ZnO:Al) films prepared by RF magnetron co-sputtering at room temperature were thermally treated in hydrogen ambient at 300 8C to enhance the films’ characteristics for transparent conductive oxide applications. The electrical properties of the hydrogen-annealed films were improved and preserved in air ambient, even though the crystal structures of the films were not changed by the thermal treatment. The optical and oxygen bonding characteristics of ZnO:Al films manifested that absorbed oxygen species on the films were removed by the hydrogenannealing process. These results supported that the development of the electrically reliable ZnO:Al films could be realized using the hydrogenannealing process.
Keywords :
Al-doped ZnO (ZnO:Al) , Transparent conductive oxide (TCO) , Hydrogen treatment
Journal title :
Applied Surface Science
Serial Year :
2007
Journal title :
Applied Surface Science
Record number :
1003956
Link To Document :
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