Title of article
Stabilization in electrical characteristics of hydrogen-annealed ZnO:Al films
Author/Authors
Byeong-Yun Oh، نويسنده , , Min-Chang Jeong، نويسنده , , Jae-Min Myoung، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2007
Pages
5
From page
7157
To page
7161
Abstract
Al-doped ZnO (ZnO:Al) films prepared by RF magnetron co-sputtering at room temperature were thermally treated in hydrogen ambient at
300 8C to enhance the films’ characteristics for transparent conductive oxide applications. The electrical properties of the hydrogen-annealed films
were improved and preserved in air ambient, even though the crystal structures of the films were not changed by the thermal treatment. The optical
and oxygen bonding characteristics of ZnO:Al films manifested that absorbed oxygen species on the films were removed by the hydrogenannealing
process. These results supported that the development of the electrically reliable ZnO:Al films could be realized using the hydrogenannealing
process.
Keywords
Al-doped ZnO (ZnO:Al) , Transparent conductive oxide (TCO) , Hydrogen treatment
Journal title
Applied Surface Science
Serial Year
2007
Journal title
Applied Surface Science
Record number
1003956
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