Abstract :
CaxCo4Sb12 skutterudite thin films have been prepared by pulsed laser deposition using a Nd:YAG laser working at 532 or 266 nm of
wavelength. Characterization has been carried out by X-ray diffraction, atomic force microscopy and scanning electron microscopy. Emphasis has
been put on the difficulty to obtain the skutterudite phase. Influence of the deposition temperature, the way of sticking the substrate, the laser
fluence, the base pressure prior to deposition and the laser wavelength has been studied. All parameters revealed to have a drastic effect, and the
skutterudite could only be achieved in a very narrow range of temperature and laser fluence, for a given wavelength, showing the importance on
how these parameters are measured to ensure reproducible results.
Keywords :
Pulsed laser deposition , XRD , Skutterudite thin films , AFM