Author/Authors :
Zhifeng Shi، نويسنده , , Shikai Zhang، نويسنده , , Bin Wu، نويسنده , , Xupu Cai، نويسنده , , Jinxiang Zhang، نويسنده , , Wei Yin، نويسنده , , Hui Wang، نويسنده , , Jin Wang، نويسنده , , Xiaochuan Xia، نويسنده , , Xin Dong، نويسنده , , Baolin Zhang، نويسنده , , Guotong Du، نويسنده ,
Abstract :
High-quality ZnO thin films were deposited on 6Hsingle bondSiC substrates using metal–organic chemical vapor deposition system. The physical properties of as-prepared ZnO layers under various oxygen flow rate were thoroughly studied. An increase in the O/Zn ratio yielded a decrease in growth rate. The experimental results also indicated that the size of ZnO nanoparticles, lattice constant and compressive stress inside the films displayed a regular variety as a function of O2-flow rate. In addition, with increase of oxygen discharge, the position of deep-level emission in photoluminescence spectra demonstrated a significant shift, with transformation from oxygen vacancy to zinc vacancy. The qualitative calculation from X-ray photoelectron spectroscopy data showed that higher O2-flow rate was able to promote Osingle bondZn bond formation and reduce the number of oxygen vacancies.
Keywords :
ZnO , Deep-level emission , Oxygen vacancy , Oxygen flow rate