Sn whiskers removed by energy photo flashing

Sn whiskers have been known to be the major issue resulting in electronic circuit shorts. In this study, we present a novel energy photo flashing approach (photosintering) to shorten and eliminate Sn whiskers. It has been found that photosintering is very effective to modify and remove Sn whiskers; only a sub-millisecond duration photosintering can amazingly get rid of over 90 vol.% of Sn whiskers. Moreover, this photosintering approach has also been proved to cause no damages to electronic devices, suggesting it is a potentially promising way to improve Sn-based electronic surface termination.