Title of article
Electrosynthesis of CZTS films by sulfurization of CZT precursor: Effect of soft annealing treatment
Author/Authors
K.V. Gurav b، نويسنده , , S.M. Pawar، نويسنده , , Seung Wook Shin a، نويسنده , , M.P. suryawanshi، نويسنده , , G.L. Agawane، نويسنده , , P.S. Patil، نويسنده , , Jong Ha Moon، نويسنده , , J.H. Yun، نويسنده , , Jin Hyeok Kim b، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2013
Pages
7
From page
74
To page
80
Abstract
In the present work, CZTS thin films have been prepared by sulfurization of electrodeposited Cu–Zn–Sn (CZT) precursor. Prior to sulfurization, as-deposited CZT precursors have been soft annealed in Ar atmosphere at different temperatures (250–350 °C). The structural, morphological, compositional and optical properties of the films have been investigated in detail. It is found that, soft annealing temperature has a significant impact on the properties of CZTS thin films. The systematic study on the improvement in the properties of CZTS films using soft annealing route has been studied and discussed.
Keywords
X-ray diffraction , Cu2ZnSnS4 (CZTS) thin films , Soft annealing , Electrodeposition , Cyclic voltammetry (CV)
Journal title
Applied Surface Science
Serial Year
2013
Journal title
Applied Surface Science
Record number
1007787
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