Title of article :
The influence of homo-buffer layer on structural, optical and electrical properties of ZnO:Al films
Author/Authors :
Q.K. Li، نويسنده , , J.B. Wang، نويسنده , , B. Li، نويسنده , , X.L. Zhong، نويسنده , , F. Wang، نويسنده , , Kathryn C.B. Tan، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2013
Pages :
6
From page :
623
To page :
628
Abstract :
Aluminum-doped ZnO (AZO) films were fabricated on glass by pulsed-laser deposition based on orthogonal design, and influences of homo-buffer layer on structural, optical and electrical properties of AZO films were investigated. The experiment results demonstrate that the homo-buffer layer is very beneficial to improve the quality of AZO films. In addition, both deposition temperature of homo-buffer layer (Thomo-buffer) and deposition oxygen pressure of homo-buffer layer (Phomo-buffer) have a considerable influence on the properties of AZO films. By optimizing the deposition parameters of homo-buffer layer and AZO film synthetically, the AZO film with low resistivity (2.13 × 10−4 Ω cm) and high transmittance (89.1%) has been obtained, which is a promising candidate material in transparent electrode applications.
Keywords :
Pulsed-laser deposition , AZO films , Homo-buffer layer , Orthogonal design
Journal title :
Applied Surface Science
Serial Year :
2013
Journal title :
Applied Surface Science
Record number :
1007862
Link To Document :
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