Title of article :
Influence of excitation light wavelength on the photoluminescence properties for ZnO films prepared by magnetron sputtering
Author/Authors :
Q.P Wang، نويسنده , , X.J. Zhang، نويسنده , , G.Q. Wang، نويسنده , , S.H. Chen، نويسنده , , X.H. Wu، نويسنده , , H.L. Ma، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
5
From page :
5100
To page :
5104
Abstract :
Highly orientated polycrystalline ZnO films were deposited on sapphire, silicon and quartz substrates at room temperature by r.f. magnetron sputtering. Different photoluminescence (PL) spectra were observed when excited with different wavelength light. A UV emission peak (356 nm) and a blue peak (446 nm) were generated for the films on sapphire, silicon and quartz substrates, and only the 446 nm blue emission appeared for the films on glass substrates when the wavelength of the excitation light was 270 nm. With increasing the wavelength of the excitation light up to 300 and 320 nm, the UV emission disappeared for films on various substrates and the wavelength of the PL peaks increased up to 488 and 516 nm, respectively. When the wavelength of the excitation light increased to 398 nm, the PL spectrum becomes a wide band that is consistent with three emission peaks.
Keywords :
Excitation light , ZnO films , Photoluminescence , RF sputtering
Journal title :
Applied Surface Science
Serial Year :
2008
Journal title :
Applied Surface Science
Record number :
1009285
Link To Document :
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