Stability of the tunneling current across Si nanochain network

The stability of the current across Si nanochain network is investigated using a micromanipulator in a scanning electron microscope system. We confirm that the current is dominated by the tunneling of electrons between Si nanoparticles. We observe large current fluctuations at a high bias voltage, while the current is stable at a relatively low bias voltage. The origin of the fluctuation is discussed in terms of percolation.