Title of article :
A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions
Author/Authors :
Satoshi Ninomiya *، نويسنده , , Yoshihiko Nakata، نويسنده , , Yoshiro Honda، نويسنده , , Kazuya Ichiki، نويسنده , , Toshio Seki، نويسنده , , Takaaki Aoki، نويسنده , , Jiro Matsuo، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
3
From page :
1588
To page :
1590
Abstract :
In this report, we propose to use the incidence of cluster ions that are much larger than molecular ions as a fragment-free ionization technique for organic secondary ion mass spectrometry. Secondary ions were measured for amino acid and peptide targets bombarded with 3, 8 and 13 keV large Ar cluster ions. The relative yields of the fragment ions decreased drastically with increasing incident cluster size. Fragment-free ionization of the molecule was accomplished when large cluster ions with optimized size and energy were incident on a biomolecular sample.
Keywords :
Fragment-free ionization , TOF , mass spectrometry , Cluster ion
Journal title :
Applied Surface Science
Serial Year :
2008
Journal title :
Applied Surface Science
Record number :
1009890
Link To Document :
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