Title of article
Defect engineering of ZnO
Author/Authors
M.H Weber، نويسنده , , F.A. Selim، نويسنده , , D. Solodovnikov، نويسنده , , K.G. Lynn، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2008
Pages
3
From page
68
To page
70
Abstract
The defect responsible for the transparent to red color change of nominally undoped ZnO bulk single crystals is investigated. Upon annealing in the presence of metallic Zn as reported by Halliburton et al. and also Ti and Zr a native defect forms with an energy level about 0.7 eV below the conduction band. This change is reversible upon annealing in oxygen. Optical transmission data along with positron depth profiles and annealing studies are combined to identify the defect as oxygen vacancies. Vacancy clustering occurs at about 500 °C if isolated zinc and oxygen vacancies. In the absence of zinc vacancies, clusters form at about 800 °C.
Keywords
ZnO , Positron annihilation , Defect engineering , Depth profiles
Journal title
Applied Surface Science
Serial Year
2008
Journal title
Applied Surface Science
Record number
1010146
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