Author/Authors :
Haiyong Gao، نويسنده , , Fawang Yan، نويسنده , , Yang Zhang، نويسنده , , Jinmin Li، نويسنده , , Yiping Zeng، نويسنده , , Junxi Wang، نويسنده ,
Abstract :
Sapphire substrates were nano-patterned by inductive coupled plasma etching process. Nonpolar a-plane GaN films were grown on planar and nano-patterned r-plane sapphire substrates by metal organic chemical vapor deposition. The anisotropic characteristic and the crystalline quality of the a-plane GaN films were studied through XRD rocking curves. The cross section and surface morphologies of the a-plane GaN films were studied using SEM and AFM measurements, respectively. The crystal quality and surface flatness of the nonpolar a-plane GaN were greatly improved through the usage of the nano-patterned r-plane sapphire substrates.
Keywords :
MOCVD , Nano-patterned , GaN , Nonpolar