Title of article :
Post-annealing effect upon optical properties of electron beam evaporated molybdenum oxide thin films
Author/Authors :
Shih-Yuan Lin، نويسنده , , Ying-Chung Chen، نويسنده , , Chih-Ming Wang، نويسنده , , Po-Tsung Hsieh، نويسنده , , Shun-Chou Shih، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
7
From page :
3868
To page :
3874
Abstract :
Molybdenum oxide (MoO3) thin films were deposited by electron beam evaporation. The chemical composition, microstructure, optical and electrical properties of MoO3 thin films depend on the annealing temperature and ambient atmosphere. X-ray diffraction (XRD) shows that crystalline MoO3 films can be obtained at various post-annealing temperatures from 200 to 500 °C in N2 and O2. X-ray photoelectron spectroscopy (XPS) results reveal that the O-1s emission peak was shifted slightly toward lower binding energies as the annealing temperature in N2 was increased. The oxygen vacancies and conductivity of MoO3 film increased with the annealing temperature. However, when the MoO3 films were annealed in an atmosphere of O2, the optical transmission, the O/Mo ratio and the photon energy increased with the annealing temperature. The results differ from those for films annealed in a N2 atmosphere.
Keywords :
MoO3 thin films , Post-annealing , Optical properties , Oxygen vacancies , Electron beam evaporation
Journal title :
Applied Surface Science
Serial Year :
2009
Journal title :
Applied Surface Science
Record number :
1011009
Link To Document :
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