Title of article :
Theoretical characterization of carrier compensation in P-doped diamond
Author/Authors :
C.X. Yan، نويسنده , , Y. Dai، نويسنده , , Z. M. Guo، نويسنده , , B.B. Huang، نويسنده , , D.H. Liu، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
7
From page :
3994
To page :
4000
Abstract :
Based on the electron–hole recombination ratio (the number of electron–hole recombination in unit time and volume), we have examined several P complexes surrounded with vacancy (V) or H to explore the effect of carrier compensation on the electronic properties in P-doped diamond by first-principle calculations. Our calculated results show that the monovacancy complex P–V–H is not a valid recombination center in P-doped diamond, in which case electron cannot be recombined and thus donor cannot be compensated. However, the level in the band gap introduced by the divacancy complex P–2V–2H is a valid recombination center, which accelerates the electron–hole recombination at high ratio. For the trivacancy complex P–3V, three levels are introduced near the middle of the band gap, which may serve as more valid recombination centers than others. In this case, the electron–hole recombination ratio enhances successively, namely, the compensator density increases continuously too. In addition, the electronic properties of the P-related complexes in negative charge states are similar with those of neutral charge states. The study may explain well the experimental results and be useful for the further experiment research.
Keywords :
P-doped diamond , Carrier compensation , The first principle
Journal title :
Applied Surface Science
Serial Year :
2009
Journal title :
Applied Surface Science
Record number :
1011033
Link To Document :
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