Title of article :
X-ray photoelectron spectroscopy study on the CrN surface grown on sapphire substrate to control the polarity of ZnO by plasma-assisted molecular beam epitaxy
Author/Authors :
J.H. Chang، نويسنده , , M.N. Jung، نويسنده , , J.S. Park، نويسنده , , S.H. Park، نويسنده , , I.H. Im، نويسنده , , H.J. Lee، نويسنده , , J.S. Ha، نويسنده , , K. Fujii، نويسنده , , T. Hanada، نويسنده , , T. Yao، نويسنده , , Y. Murakami، نويسنده , , N. Ohtsu، نويسنده , , G.S. Kil، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
5
From page :
8582
To page :
8586
Abstract :
We have studied on the polarity selection procedure of ZnO grown on CrN buffer by using X-ray photoelectron spectroscopy (XPS). XPS studies have been performed on the O- and Zn-treated CrN/Al2O3surfaces and revealed that Cr2O3 and Zn-chromate-like structures are formed on O- and Zn-treated CrN surfaces, respectively. The polarity selection procedure is explained in terms of the variation of bonding coordination by the formation of ZnO on the topmost O- and Zn-atoms of each surface.
Keywords :
Polarity , ZnO , CrN , X-ray photoelectron spectroscopy
Journal title :
Applied Surface Science
Serial Year :
2009
Journal title :
Applied Surface Science
Record number :
1012130
Link To Document :
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