Abstract :
The emission yields of the secondary ions are measured by using a conventional time of flight (TOF) technique under bombardments of Mg and C2, Ni and Si2 with different energies, and Cn, Sin and Nin (n = 1–3) with the different charge states and with energy of 1.5 MeV per atom, respectively. For the bombardments of Cn, Sin and Nin, the enhancements of the secondary ion emissions increase with increasing cluster sizes and charge states. For the bombardments of Mg and C2, Ni and Si2, although the mass and the nuclear charges of C2 and Si2 are the same as or equivalent to Mg or Ni, respectively, the enhancements of the secondary ion emissions induced by the clusters of C2 and Si2 in a wide energy range are also clearly indicated. The instantaneous collective interaction of the cluster constituents plays an important role in the secondary ion emissions.
