Title of article :
Effect of Youngʹs modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction
Author/Authors :
Q. Chen، نويسنده , , W.G. Mao، نويسنده , , Y.C. Zhou، نويسنده , , C. Lu، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2010
Pages :
5
From page :
7311
To page :
7315
Abstract :
Subjected to thermal cycling, the apparent Youngʹs modulus of air plasma-sprayed (APS) 8 wt.% Y2O3-stabilized ZrO2 (8YSZ) thermal barrier coatings (TBCs) was measured by nanoindentation. Owing to the effects of sintering and porous microstructure, the apparent Youngʹs modulus follows a Weibull distribution and changes from 50 to 93 GPa with an increase of thermal cycling. The evolution of residual stresses in the top coating of an 8YSZ TBC system was determined by X-ray diffraction (XRD). The residual stresses derived from the XRD data are well consistent with that obtained by the Vickers indention. It is shown that the evolution of Youngʹs modulus plays an important role in improving the measurement precision of residual stresses in TBCs by XRD.
Keywords :
Thermal barrier coatings , X-ray diffraction , Residual stress , Youngיs modulus
Journal title :
Applied Surface Science
Serial Year :
2010
Journal title :
Applied Surface Science
Record number :
1013196
Link To Document :
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