• Title of article

    Effect of Youngʹs modulus evolution on residual stress measurement of thermal barrier coatings by X-ray diffraction

  • Author/Authors

    Q. Chen، نويسنده , , W.G. Mao، نويسنده , , Y.C. Zhou، نويسنده , , C. Lu، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2010
  • Pages
    5
  • From page
    7311
  • To page
    7315
  • Abstract
    Subjected to thermal cycling, the apparent Youngʹs modulus of air plasma-sprayed (APS) 8 wt.% Y2O3-stabilized ZrO2 (8YSZ) thermal barrier coatings (TBCs) was measured by nanoindentation. Owing to the effects of sintering and porous microstructure, the apparent Youngʹs modulus follows a Weibull distribution and changes from 50 to 93 GPa with an increase of thermal cycling. The evolution of residual stresses in the top coating of an 8YSZ TBC system was determined by X-ray diffraction (XRD). The residual stresses derived from the XRD data are well consistent with that obtained by the Vickers indention. It is shown that the evolution of Youngʹs modulus plays an important role in improving the measurement precision of residual stresses in TBCs by XRD.
  • Keywords
    Thermal barrier coatings , X-ray diffraction , Residual stress , Youngיs modulus
  • Journal title
    Applied Surface Science
  • Serial Year
    2010
  • Journal title
    Applied Surface Science
  • Record number

    1013196