• Title of article

    Adhesion experiments using an AFM—Parameters of influence

  • Author/Authors

    Olavio Dos Santos Ferreira، نويسنده , , Edwin Gelinck، نويسنده , , Dennis de Graaf، نويسنده , , Jürgen Hartmut Fischer، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2010
  • Pages
    8
  • From page
    48
  • To page
    55
  • Abstract
    Adhesion measurements were performed by AFM (Atomic Force Microscopy). It was shown that many parameters need to be controlled in order to provide reproducible and quantitative results. Adhesion forces were shown to depend on combination of materials characteristics and testing geometry as well as experimental protocol (contact time, contact force and contact area). This contact area was modified by means of FIB (Focused Ion Beam) milling and deliberate abrasion. As a result, a drastic change in adhesion could be observed. Still, those are problems connected to adjustment of interacting surfaces.
  • Keywords
    AFM , Tip modification , Abrasion tip , Contact time , Adhesion , FIB , Contact area
  • Journal title
    Applied Surface Science
  • Serial Year
    2010
  • Journal title
    Applied Surface Science
  • Record number

    1013269