• Title of article

    Modeling effects of abrasive particle size and concentration on material removal at molecular scale in chemical mechanical polishing

  • Author/Authors

    Yongguang Wang، نويسنده , , Yongwu Zhao *، نويسنده , , Wei An، نويسنده , , Zifeng Ni، نويسنده , , Jun Wang، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2010
  • Pages
    5
  • From page
    249
  • To page
    253
  • Abstract
    A novel material removal model as a function of abrasive particle size and concentration was established in chemical mechanical polishing (CMP) based on molecular scale mechanism, micro-contact mechanics and probability statistics. A close-form equation was firstly developed to calculate the number of effective particles. It found nonlinear dependences of removal rate on the particle size and concentration, being qualitatively agreement with the published experimental data. The nonlinear relation results from the couple relationship among abrasive number, slurry concentration and surface atoms’ binding energy with the particle size. Finally, the system parameters such as the operational conditions and materials properties were incorporated into the model as well.
  • Keywords
    CMP , Abrasive size , Modeling , Abrasive concentration
  • Journal title
    Applied Surface Science
  • Serial Year
    2010
  • Journal title
    Applied Surface Science
  • Record number

    1013303