Title of article
Dielectric and relaxation properties of thermally evaporated nanostructured bismuth sulfide thin films
Author/Authors
K. Mageshwari، نويسنده , , R. Sathyamoorthy، نويسنده , , P. Sudhagar، نويسنده , , Yong Soo Kang، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2011
Pages
9
From page
7245
To page
7253
Abstract
Nanostructured bismuth sulfide thin films were prepared onto glass substrates with particle size of 21 nm by thermal evaporation using readily prepared bismuth sulfide nanocrystallite powder. The X-ray diffraction pattern revealed that bismuth sulfide thin films exhibit orthorhombic structure. The existence of quantum confinement effect was confirmed from the observed band gap energy of 1.86 eV. AC and DC electrical conductivity of Al/BiSnc/Al structures was investigated in the frequency range 0.5–100 kHz at different temperatures (303–463 K) under vacuum. The AC conductivity (σac) is found to be proportional to angular frequency (ωs). The obtained experimental result of the AC conductivity showed that the correlated barrier hopping model is the appropriate mechanism for the electron transport in the nanostructured bismuth sulfide thin films. DC conduction mechanism in these films was studied and possible conduction mechanism in the bismuth sulfide thin films was discussed.
Keywords
Dielectric property , Relaxation property , Semiconductor , Bismuth sulfide , Thin film
Journal title
Applied Surface Science
Serial Year
2011
Journal title
Applied Surface Science
Record number
1014483
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