• Title of article

    Growth behavior and magnetic property of electroless NiCoFeP films

  • Author/Authors

    W.L. Liu، نويسنده , , S.H. Hsieh، نويسنده , , H.C. Yan، نويسنده , , W.J. Chen، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2011
  • Pages
    7
  • From page
    1806
  • To page
    1812
  • Abstract
    The electroless NiCoFeP films were deposited on a silicon substrate in a bath containing Ni2+, Co2+, and Fe2+ ions with a concentration ratio of 1:1.9:1.2. These films were characterized by using transmission electron microscope, energy dispersive X-ray spectrometer, and alternating gradient magnetometer for their microstructure, crystal structure, and magnetic properties. The result showed that the film deposited at the initial stage (about 10 s) consists of only one phase with a crystal structure of FCC Ni and a composition about Ni (69 at%), Co (19 at%), Fe (4 at%), and P (7 at%); The film deposited at the latter stage (about 30 s) consists of two phase, one is similar to that of initial stage and the other has crystal structure of HCP Co with a composition about Ni (35 at%), Co (44 at%), Fe (19 at%), and P (2 at%). The saturation magnetization and coercivity of electroless NiCoFeP films vary from 525 to 1546 emu/cm3 [0.68–2.01 T] and from 51.44 to 88.5 Oe [4.09–7.04 kA/m], respectively.
  • Keywords
    Growth behavior , Electroless plating , Magnetic property , NiCoFeP films
  • Journal title
    Applied Surface Science
  • Serial Year
    2011
  • Journal title
    Applied Surface Science
  • Record number

    1015435