Title of article
Metal oxide thin films as sensing layers for ozone detection Original Research Article
Author/Authors
M. Suchea، نويسنده , , N. Katsarakis، نويسنده , , S. Christoulakis، نويسنده , , M. Katharakis، نويسنده , , T. Kitsopoulos، نويسنده , , G. Kiriakidis، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
5
From page
9
To page
13
Abstract
In2O3−x thin films with a thickness of 100–990 nm were grown by dc magnetron sputtering. Their structural, electrical and ozone sensing properties were analyzed. Structural investigations carried out by electron probe micro analysis, secondary ion mass spectrometry and atomic force microscopy showed a strong correlation between stoichiometry, surface topology and gas sensitivity. Moreover, the electrical conductivity of In2O3−x thin films exhibited a change of over six orders of magnitude during photoreduction with ultraviolet light and subsequent oxidation in ozone atmosphere at room temperature.
Keywords
Stoichiometry , Ozone , In2O3?x thin films , Sensing
Journal title
Analytica Chimica Acta
Serial Year
2006
Journal title
Analytica Chimica Acta
Record number
1036037
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