Title of article
Ultrahigh vacuum scanning probe microscopy studies of carbon onions
Author/Authors
S.M Hou، نويسنده , , C.G Tao، نويسنده , , G.M Zhang، نويسنده , , X.Y. Zhao، نويسنده , , Z.Q Xue، نويسنده , , Z.J Shi، نويسنده , , Z.N Gu، نويسنده ,
Issue Information
ماهنامه با شماره پیاپی سال 2001
Pages
5
From page
300
To page
304
Abstract
Carbon onions were prepared by DC arc charge method. The behavior and electronic properties of carbon onions on highly oriented pyrolytic graphite (HOPG) substrate were studied by ultrahigh vacuum atomic force microscopy and scanning tunneling microscopy (UHV AFM/STM). UHV AFM/STM images showed that these ellipsoidal carbon onions tended to aggregate into clusters on the surface of HOPG. The scanning tunneling spectroscopy indicated that the electrical properties of carbon onions were between graphite and single-shell fullerenes.
Keywords
Carbon onions , Scanning tunneling spectroscopy , Scanning probe microscopy
Journal title
Physica E Low-dimensional Systems and Nanostructures
Serial Year
2001
Journal title
Physica E Low-dimensional Systems and Nanostructures
Record number
1044655
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