Title of article
Conductance images between two STM probes in graphene
Author/Authors
Takeshi Nakanishi، نويسنده , , Tsuneya Ando، نويسنده ,
Issue Information
ماهنامه با شماره پیاپی سال 2009
Pages
3
From page
726
To page
728
Abstract
The conductance image between two probes of scanning–tunneling-microscopy (STM) is calculated in a graphene within a tight-binding model and a realistic model for STM probes. A Kekulé-type pattern appears due to interference of states at K and K′ points.
Keywords
Graphite , Carbon nanotube , Kekulé-type pattern , Multi-probe STM , Quantum interference
Journal title
Physica E Low-dimensional Systems and Nanostructures
Serial Year
2009
Journal title
Physica E Low-dimensional Systems and Nanostructures
Record number
1048027
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