Title of article :
Conductance images between two STM probes in graphene
Author/Authors :
Takeshi Nakanishi، نويسنده , , Tsuneya Ando، نويسنده ,
Issue Information :
ماهنامه با شماره پیاپی سال 2009
Pages :
3
From page :
726
To page :
728
Abstract :
The conductance image between two probes of scanning–tunneling-microscopy (STM) is calculated in a graphene within a tight-binding model and a realistic model for STM probes. A Kekulé-type pattern appears due to interference of states at K and K′ points.
Keywords :
Graphite , Carbon nanotube , Kekulé-type pattern , Multi-probe STM , Quantum interference
Journal title :
Physica E Low-dimensional Systems and Nanostructures
Serial Year :
2009
Journal title :
Physica E Low-dimensional Systems and Nanostructures
Record number :
1048027
Link To Document :
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